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Process Yields

Main Index > Process Yields

Content  


Semiconductor Industry - Overview

Semiconductor Materials

Crystal Growth and Wafer Preparation

Contamination Control

Wafer Fabrication - Overview

Process Yields

Epitaxy

Oxidation

Lithography

Reactive Plasma Etching

Film Deposition

Ion Implantation

Metallization

Wafer Test and Evaluation

Assembly and Packaging

Appendix



Semiconductor News
 


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  •  Links  

    Defect and Yield Analysis
    Yield Analysis
    Analyzing Semiconductor Failure
    Failure Analysis Is a Useful Feedback Tool for System Designers
    Failure analysis techniques for semiconductors and other devices
    Improving yield in IC manufacturing by statistical analysis of a large database
    Investigating yield loss caused by airborne organophosphates
    Model-based approach allows design for yield
    Semiconductor Yield Links
    Splitting Wafer Lots in Semiconductor Manufacturing Part I The Statistician's Toolbox
    Understanding Soft and Firm Errors in Semiconductor Devices [PDF]
    Using bitmap analysis to help identify yield-critical issues in the fab
    VLSI chip yield demonstration - Applet
    Yield Forecasting
    Yield Management on Semiconductor International



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